Product Identification
|
Item |
Content |
|
Product Name |
G4 Sulfuric Acid |
|
Category |
Semiconductor Wet Electronic Chemical |
|
Chemical Name |
Sulfuric Acid |
|
Chemical Formula |
\(\boldsymbol{H_2SO_4}\) |
|
CAS No. |
7664-93-9 |
|
Molecular Weight |
98.08 |
|
Grade Standard |
SEMI G4 Grade |
Product Description
4 Sulfuric Acid is ultra-high-purity strong inorganic acid manufactured for advanced semiconductor wafer fabrication. Produced by special purification and ultra-fine filtration processes, it features ultra-low trace-metal impurities and controlled particle level, complying with SEMI G4 specification. It is widely used for wafer cleaning, photoresist stripping, organic residue removal and surface treatment in IC manufacturing, minimizing contamination risk for yield-critical micro-electronics processes.
Appearance: Colorless, clear oily liquid, odorless.
Technical Specifications (SEMI G4 Standard)
|
Test Item |
Specification |
|
Assay (\(H_2SO_4\)) |
96.0 ~ 98.0 wt% |
|
Appearance |
Colorless & clear oily liquid |
|
Color (APHA) |
≤ 10 |
|
Density @ 20 °C |
1.83-1.85 g/cm³ |
|
Evaporation Residue |
≤ 100 ppb |
|
Particles ≥0.2 μm |
≤100 pcs/mL |
|
Individual trace metal (Al, Fe, Cu, Na, K, Ca, Mg, Zn, Ni, Cr etc.) |
≤ 10 ppb each |
|
Chloride (\(Cl^-\)) |
≤100 ppb |
|
Nitrate (\(NO_3^-\)) |
≤200 ppb |
|
Phosphate (\(PO_4^{3-}\)) |
≤200 ppb |
Applications
1.Semiconductor wafer cleaning, remove organic contaminants, particle residues and metallic impurities.
2.Photoresist stripping process for IC manufacturing.
3.Preparation of mixed wet-chemistry solutions for semiconductor front-end process.
4.Surface treatment for advanced packaging, MEMS devices.
Packaging
● 330 kg HDPE drum
● 1500 kg IBC tote
● 20MT ISO container tank (bulk)
Filled in clean-room environment to avoid secondary contamination.
Storage & Shelf-life
● Store in cool, dry, well-ventilated warehouse, keep tightly sealed, away from moisture, heat and incompatible substances.
● Avoid direct sunlight.
● Shelf-life: 12 months under recommended storage conditions.
Handling & Safety Remarks
● Strong corrosive material. Wear acid-resistant PPE (goggle, acid-proof glove, apron) during operation.
● Always add acid slowly into water; never pour water into concentrated sulfuric acid (strong exothermic reaction).
● Refer to corresponding SDS for full hazard information, first-aid, spill handling and transportation guidance.
Quality Assurance
Each delivery shall be accompanied by batch-specific Certificate of Analysis (COA). All production and filling procedures follow clean-room control to meet SEMI G4 contamination requirements.
Certificate of Analysis
|
Product Name |
Grade |
Relative molecular mass |
Molecular formula |
|
Sulfuric acid |
Electronic chemicals G4 |
98.07 |
H2SO4 |
|
Inspect items |
Specifications |
Inspect items |
Specifications |
|
Appearance |
Colorless transparent liquid |
Nickel (Ni), ppt |
≤100 |
|
Assay (H2SO4), % |
≥96.0 |
Cupric (Cu), ppt |
≤100 |
|
Chromaticity, Hazen units |
≤10 |
Zinc (Zn), ppt |
≤100 |
|
Burning residue (as sulfuric), ppm |
≤2 |
Gallium (Ga), ppt |
≤100 |
|
Chloride (Cl), ppb |
≤50 |
Germanium (Ge), ppt |
≤100 |
|
Nitrate (NO3), ppb |
≤50 |
Arsenic (As), ppt |
≤100 |
|
Ammonium salt (NH4), ppb |
≤100 |
Strontium (Sr), ppt |
≤100 |
|
Reduced potassium permanganate substance(asSO2), ppm |
≤2 |
Zirconium (Zr), ppt |
≤100 |
|
Lithium (Li), ppt |
≤100 |
Niobium (Nb), ppt |
≤100 |
|
Beryllium (Be), ppt |
≤100 |
Molybdenum (Mo), ppt |
≤100 |
|
Boron (B), ppt |
≤100 |
Silver (Ag), ppt |
≤100 |
|
Sodium (Na), ppt |
≤100 |
Cadmium (Cd), ppt |
≤100 |
|
Magnesium (Mg), ppt |
≤100 |
Tin (Sn), ppt |
≤100 |
|
Aluminum (Al), ppt |
≤100 |
Barium (Ba), ppt |
≤100 |
|
Potassium (K), ppt |
≤100 |
Tantalum (Ta), ppt |
≤100 |
|
Calcium (Ca), ppt |
≤100 |
Gold (Au), ppt |
≤100 |
|
Titanium (Ti), ppt |
≤100 |
Thallium (Tl), ppt |
≤100 |
|
Vanadium (V), ppt |
≤100 |
Lead (Pb), ppt |
≤100 |
|
Chromium (Cr), ppt |
≤100 |
Bismuth (Bi), ppt |
≤100 |
|
Manganese (Mn), ppt |
≤100 |
Particles (≥0.2μm), number/mL |
≤300 |
|
Iron (Fe), ppt |
≤100 |
Particles (≥0.3μm), number/mL |
≤100 |
|
Cobalt (Co), ppt |
≤100 |
Particles (≥0.5μm), number/mL |
≤5 |
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